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DAC
2000
ACM
14 years 8 months ago
High-level simulation of substrate noise generation including power supply noise coupling
Substrate noise caused by large digital circuits will degrade the performance of analog circuits located on the same substrate. To simulate this performance degradation, the total...
Marc van Heijningen, Mustafa Badaroglu, Sté...
DAC
1997
ACM
13 years 11 months ago
Power Supply Noise Analysis Methodology for Deep-Submicron VLSI Chip Design
This paper describes a new design methodology to analyze the on-chip power supply noise for high performance microprocessors. Based on an integrated package-level and chip-level p...
Howard H. Chen, David D. Ling
ASPDAC
2008
ACM
103views Hardware» more  ASPDAC 2008»
13 years 9 months ago
Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification
This paper presents an all digital measurement circuit called "gated oscillator" for capturing waveforms of dynamic power supply noise. The gated oscillator is constructe...
Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoy...