f abstraction as applicable to break the problem's complexity, and innovating better techniques to address complexity of new microarchitectural features. Validation techniques...
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges...
David Atienza, Giovanni De Micheli, Luca Benini, J...
World steel trade becomes more competitive every day and new high international quality standards and productivity levels can only be achieved by applying the latest computational...
—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
- In this paper, we explore a new concept, called on-chip diversity, and introduce a design methodology for such emerging systems. Simply speaking, on-chip diversity means mixing d...