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DT
2000
88views more  DT 2000»
13 years 7 months ago
Postsilicon Validation Methodology for Microprocessors
f abstraction as applicable to break the problem's complexity, and innovating better techniques to address complexity of new microarchitectural features. Validation techniques...
Hemant G. Rotithor
ASPDAC
2008
ACM
103views Hardware» more  ASPDAC 2008»
13 years 9 months ago
Reliability-aware design for nanometer-scale devices
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges...
David Atienza, Giovanni De Micheli, Luca Benini, J...
KDD
2004
ACM
161views Data Mining» more  KDD 2004»
14 years 1 months ago
ANN quality diagnostic models for packaging manufacturing: an industrial data mining case study
World steel trade becomes more competitive every day and new high international quality standards and productivity levels can only be achieved by applying the latest computational...
Nicolás de Abajo, Alberto B. Diez, Vanesa L...
DATE
2009
IEEE
137views Hardware» more  DATE 2009»
14 years 2 months ago
A self-adaptive system architecture to address transistor aging
—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
Omer Khan, Sandip Kundu
ASPDAC
2004
ACM
98views Hardware» more  ASPDAC 2004»
14 years 1 months ago
Enabling on-chip diversity through architectural communication design
- In this paper, we explore a new concept, called on-chip diversity, and introduce a design methodology for such emerging systems. Simply speaking, on-chip diversity means mixing d...
Tudor Dumitras, Sam Kerner, Radu Marculescu