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» Design and Analysis of a Robust Pipelined Memory System
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DAC
2008
ACM
14 years 8 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
SSS
2007
Springer
130views Control Systems» more  SSS 2007»
14 years 1 months ago
Decentralized Detector Generation in Cooperative Intrusion Detection Systems
We consider Cooperative Intrusion Detection System (CIDS) which is a distributed AIS-based (Artificial Immune System) IDS where nodes collaborate over a peer-to-peer overlay netwo...
Rainer Bye, Katja Luther, Seyit Ahmet Çamte...
AES
2005
Springer
137views Cryptology» more  AES 2005»
13 years 7 months ago
Design of a multimedia processor based on metrics computation
Media-processing applications, such as signal processing, 2D and 3D graphics rendering, and image compression, are the dominant workloads in many embedded systems today. The real-...
Nader Ben Amor, Yannick Le Moullec, Jean-Philippe ...
DAC
2004
ACM
14 years 8 months ago
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
Chong Zhao, Xiaoliang Bai, Sujit Dey
TSMC
2008
138views more  TSMC 2008»
13 years 7 months ago
Comparison of Adaptive Critic-Based and Classical Wide-Area Controllers for Power Systems
Abstract--An adaptive critic design (ACD)-based damping controller is developed for a thyristor-controlled series capacitor (TCSC) installed in a power system with multiple poorly ...
Swakshar Ray, Ganesh K. Venayagamoorthy, Balarko C...