8497 search results - page 106 / 1700 » Design for an Optimal Probe |
DAC
2005
ACM
14 years 10 months ago
2005
ACM
As the d esig n-m anu factu ring interface becom es increasing ly com plicated with IC technolog y scaling , the correspond ing process variability poses g reat challeng es for na...
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
Core-based system-on-chips (SoCs) fabricated on threedimensional (3D) technology are emerging for better integration capabilities. Effective test architecture design and optimizat...
GLOBECOM
2008
IEEE
14 years 3 months ago
2008
IEEE
—The effect of antenna mutual coupling on fading correlation in compact MIMO arrays has received considerable attention. By contrast, relatively little attention has been paid to...
APCCAS
2006
IEEE
14 years 3 months ago
2006
IEEE
— The DCT-based JPEG standard is certainly one of the most successful applications of transform coding methods for still digital images. A commonly recognized disadvantage of the...
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
Multi-site testing is a popular and effective way to increase test throughput and reduce test costs. We present a test throughput model, in which we focus on wafer testing, and co...