Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
Sayeed A. Badrudduza, Ziyan Wang, Giby Samson, Law...
Current operating systems offer basic support for network interface controllers (NICs) supporting remote direct memory access (RDMA). Such support typically consists of a device d...
This paper presents a scalable, adaptive and timebounded general approach to assure reliable, real-time Node-Failure Detection (NFD) for large-scale, high load networks comprised ...
Matthew Gillen, Kurt Rohloff, Prakash Manghwani, R...
Process related variations are considered a major concern in emerging sub-65nm technologies. In this paper, we investigate the impact of process variations on different types of c...
This paper describes the design of a smart sensor for label-free detection of DNA hybridization. The sensor is based on a direct electrical transduction principle: it measures imp...