85 search results - page 6 / 17 » Designing Memory Subsystems Resilient to Process Variations |
JCP
2008
13 years 8 months ago
2008
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
CLUSTER
2005
IEEE
14 years 2 months ago
2005
IEEE
Current operating systems offer basic support for network interface controllers (NICs) supporting remote direct memory access (RDMA). Such support typically consists of a device d...
HASE
2007
IEEE
14 years 3 months ago
2007
IEEE
This paper presents a scalable, adaptive and timebounded general approach to assure reliable, real-time Node-Failure Detection (NFD) for large-scale, high load networks comprised ...
ISQED
2007
IEEE
14 years 3 months ago
2007
IEEE
Process related variations are considered a major concern in emerging sub-65nm technologies. In this paper, we investigate the impact of process variations on different types of c...
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
This paper describes the design of a smart sensor for label-free detection of DNA hybridization. The sensor is based on a direct electrical transduction principle: it measures imp...