124 search results - page 18 / 25 » Designing Reliable Digital Molecular Electronic Circuits |
DAC
2008
ACM
14 years 8 months ago
2008
ACM
As integrated circuit technology plumbs ever greater depths in the scaling of feature sizes, maintaining the paradigm of deterministic Boolean computation is increasingly challeng...
JCP
2007
13 years 7 months ago
2007
—This paper describes an Internet-based laboratory, named Remote Monitored and Controlled Laboratory (RMCLab) developed at University of Patras, Greece, for electrical engineerin...
ATS
2009
IEEE
13 years 5 months ago
2009
IEEE
Negative bias temperature instability (NBTI) has been a significant reliability concern in current digital circuit design due to its effect of increasing the path delay with time a...
DATE
2010
IEEE
14 years 14 days ago
2010
IEEE
- Electronic systems for safety-critical automotive applications must operate for many years in harsh environments. Reliability issues are worsening with device scaling down, while...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Variability of process parameters makes prediction of digital circuit timing characteristics an important and challenging problem in modern chip design. Recently, statistical stat...