124 search results - page 6 / 25 » Designing Reliable Digital Molecular Electronic Circuits |
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
TVLSI
2008
13 years 7 months ago
2008
Thermal management is critical for integrated circuit (IC) design. With each new IC technology generation, feature sizes decrease, while operating speeds and package densities incr...
DAC
1994
ACM
13 years 11 months ago
1994
ACM
Higher levels of integration have led to a generation of integrated circuits for which power dissipation and reliability are major design concerns. In CMOS circuits, both of these ...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Minimizing power consumption is vitally important in embedded system design; power consumption determines battery lifespan. Ultralow-power designs may even permit embedded systems...
CL
2000
Springer
13 years 11 months ago
2000
Springer
A number of diagnostic and optimisation problems in Electronics Computer Aided Design have usually been handled either by specific tools or by mapping them into a general problem s...