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ETS
2007
IEEE
91views Hardware» more  ETS 2007»
14 years 1 months ago
PPM Reduction on Embedded Memories in System on Chip
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests a...
Said Hamdioui, Zaid Al-Ars, Javier Jiménez,...
IFIP
1993
Springer
13 years 11 months ago
Plant Engineering: Conceptual Modeling and Modular Design of a Computer Aided Environment
When designing a plant for continuous or semi-continuous processes, such as paper pulp or petrochemical production systems, engineers face very complex tasks, which are only in pa...
Cláudio Walter, José Palazzo M. de O...
IJDST
2011
117views more  IJDST 2011»
12 years 11 months ago
Integrating Production Automation Expert Knowledge Across Engineering Domains
The engineering of complex production automation systems involves experts from several backgrounds, such as mechanical, electrical, and software engineering. The production automa...
Thomas Moser, Stefan Biffl, Wikan Danar Sunindyo, ...
DLOG
2003
13 years 8 months ago
Applying Description Logic to Product Behavioral Design within Advanced CAD Systems
In this paper, we investigate the use of Description Logic (DL) for representing Product Behavioral constraints in Computer Aided Design (CAD) Systems. In an integrated design app...
François de Bertrand de Beuvron, Amadou Cou...
ISCAS
2006
IEEE
135views Hardware» more  ISCAS 2006»
14 years 1 months ago
A sensor system on chip for wireless microsystems
Recent years have seen the rapid development of microsensor technology, system on chip design, wireless technology and ubiquitous computing. When assembled into a complex microsys...
L. Wang, Nizamettin Aydin, A. Astaras, M. Ahmadian...