Arbitrary faults of a single node in a time-triggered architecture (TTA) bus topology system may cause error propagation to correct nodes and may lead to inconsistent system state...
Noise affects circuit operation by increasing gate delays and causing latches to capture incorrect values. Noise analysis techniques can detect some of such noise faults, but accu...
Yajun Ran, Alex Kondratyev, Yosinori Watanabe, Mal...
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
Abstract. Recent works in XML change detection have focused on detecting changes to ordered or unordered XML documents. However, in real life XML documents may not always be purely...
Erwin Leonardi, Sri L. Budiman, Sourav S. Bhowmick
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...