A new algorithm for identifying stuck faults in combinational circuits that cannot be detected by a given input sequence is presented. Other than pre and post-processing steps, ce...
Vishwani D. Agrawal, Soumitra Bose, Vijay Gangaram
This paper describes novel methods of exploiting the partial, dynamic reconfiguration capabilities of Xilinx Virtex V1000 FPGAs to manage single-event upset (SEU) faults due to rad...
Maya Gokhale, Paul Graham, Michael J. Wirthlin, Da...
— The prognosis for many cancers could be improved dramatically if they could be detected while still at the microscopic disease stage. We are investigating the possibility of de...
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
Xiang Lu, Zhuo Li, Wangqi Qiu, D. M. H. Walker, We...
Software testing and retesting occurs continuously during the software development lifecycle to detect errors as early as possible. The sizes of test suites grow as software evolv...