In previous research, many mutation selection techniques have been proposed to reduce the cost of mutation analysis. After a mutant subset is selected, researchers could obtain a t...
—With the rapid development of the electricity market, both grid and market operations need to be carefully coordinated and monitored in real time. This paper focuses on system m...
—The very high levels of integration and submicron device sizes used in current and emerging VLSI technologies for FPGAs lead to higher occurrences of defects and operational fau...
In order to achieve fault tolerance, highly reliable system often require the ability to detect errors as soon as they occur and prevent the speared of erroneous information throu...
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...