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DATE
2007
IEEE
106views Hardware» more  DATE 2007»
14 years 2 months ago
Low-cost protection for SER upsets and silicon defects
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
Mojtaba Mehrara, Mona Attariyan, Smitha Shyam, Kyp...
ISCA
2009
IEEE
199views Hardware» more  ISCA 2009»
14 years 3 months ago
SigRace: signature-based data race detection
Detecting data races in parallel programs is important for both software development and production-run diagnosis. Recently, there have been several proposals for hardware-assiste...
Abdullah Muzahid, Darío Suárez Graci...
SIGSOFT
2008
ACM
14 years 9 months ago
Using assertions to help end-user programmers create dependable web macros
Web macros give web browser users ways to "program" tedious tasks, allowing those tasks to be repeated more quickly and reliably than when performed by hand. Web macros ...
Andhy Koesnandar, Sebastian G. Elbaum, Gregg Rothe...
IRI
2007
IEEE
14 years 2 months ago
Software Defects Prediction using Operating Characteristic Curves
We present a software defect prediction model using operating characteristic curves. The main idea behind our proposed technique is to use geometric insight in helping construct a...
Torsten Bergander, Yan Luo, A. Ben Hamza
DATE
1999
IEEE
120views Hardware» more  DATE 1999»
14 years 25 days ago
FreezeFrame: Compact Test Generation Using a Frozen Clock Strategy
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
Yanti Santoso, Matthew C. Merten, Elizabeth M. Rud...