434 search results - page 19 / 87 » Detection and correction of design defects in object-oriente... |
SIGMOD
2009
ACM
14 years 7 months ago
2009
ACM
views abstract groups of tasks in a workflow into high level composite tasks, in order to reuse sub-workflows and facilitate provenance analysis. However, unless a view is careful...
DATE
2003
IEEE
14 years 25 days ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
— As the feature size of transistors gets smaller, fabricating them becomes challenging. Manufacturing process follows various corrective design-for-manufacturing (DFM) steps to ...
IPPS
2007
IEEE
14 years 1 months ago
2007
IEEE
1 FPGAs are an appealing solution for the space-based remote sensing applications. However, in a low-earth orbit, configuration bits of SRAM-based FPGAs are susceptible to single-e...
ACL
1996
13 years 9 months ago
1996
In this paper, we propose a textual clue approach to help metaphor detection, in order to improve the semantic processing of this figure. The previous works in the domain studied ...