434 search results - page 22 / 87 » Detection and correction of design defects in object-oriente... |
GLVLSI
2002
IEEE
14 years 16 days ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
IWPC
2009
IEEE
14 years 2 months ago
2009
IEEE
Identification of design patterns can deliver important information to designers. Therefore, automated design pattern detection (DPD) is highly desirable when it comes to underst...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Correctness is a paramount attribute of any microprocessor design; however, without novel technologies to tame the increasing complexity of design verification, the amount of bugs...
ISCA
2010
IEEE
14 years 20 days ago
2010
IEEE
Aggressive technology scaling into the nanometer regime has led to a host of reliability challenges in the last several years. Unlike onchip caches, which can be efficiently prot...
ICST
2009
IEEE
14 years 2 months ago
2009
IEEE
Software products released into the field typically have some number of residual defects that either were not detected or could not have been detected during testing. This may be...