434 search results - page 23 / 87 » Detection and correction of design defects in object-oriente... |
VTS
2000
IEEE
13 years 12 months ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
ISICT
2003
13 years 9 months ago
2003
: Formal verification provides a rigid and thorough means of evaluating the correctness of cryptographic protocols so that even subtle defects can be identified. As the application...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...
MTDT
2000
IEEE
13 years 12 months ago
2000
IEEE
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
NA
2010
13 years 6 months ago
2010
In the numerical solution of ODEs, it is now possible to develop efficient techniques that will deliver approximate solutions that are piecewise polynomials. The resulting methods...