434 search results - page 31 / 87 » Detection and correction of design defects in object-oriente... |
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
We present the implementation and analysis of a variation tolerant version of a switch-to-switch link in a NoC. The goal is to tolerate the effects of process variations on NoC ar...
DSN
2011
IEEE
12 years 7 months ago
2011
IEEE
—As process technology shrinks devices, circuits experience accelerated wearout. Monitoring wearout will be critical for improving the efficiency of error detection and correctio...
WCRE
2009
IEEE
14 years 2 months ago
2009
IEEE
—“God class” is a term used to describe a certain type of large classes which “know too much or do too much”. Often a God class (GC) is created by accident as functionali...
IOLTS
2006
IEEE
14 years 1 months ago
2006
IEEE
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
JSS
2000
13 years 7 months ago
2000
The first goal of this paper is to empirically explore the relationships between existing object-oriented coupling, cohesion, and inheritance measures and the probability of fault...