434 search results - page 39 / 87 » Detection and correction of design defects in object-oriente... |
DATE
2010
IEEE
14 years 22 days ago
2010
IEEE
: Scaling down in very deep submicron (VDSM) technologies increases the delay, power consumption of on-chip interconnects, while the reliability and yield decrease. In high perform...
ISESE
2005
IEEE
14 years 1 months ago
2005
IEEE
Exploratory testing (ET) – simultaneous learning, test design, and test execution – is an applied practice in industry but lacks research. We present the current knowledge of ...
MPC
2004
Springer
14 years 1 months ago
2004
Springer
Software development and maintenance are costly endeavors. The cost can be reduced if more software defects are detected earlier in the development cycle. This paper introduces th...
PROCOMET
1998
13 years 9 months ago
1998
Software development and maintenance are costly endeavors. The cost can be reduced if more software defects are detected earlier in the development cycle. This paper introduces th...
ACMSE
2006
ACM
14 years 1 months ago
2006
ACM
This paper considers the design of a camera path through a scene. Given a valid set of keyframes for the camera, we want to build a camera path that avoids collisions with the sce...