434 search results - page 46 / 87 » Detection and correction of design defects in object-oriente... |
ICPR
2008
IEEE
14 years 2 months ago
2008
IEEE
This paper introduces our recently designed 9/7– 10/8 dual-tree complex filter bank and studies its application in moving object detection and segmentation. The dual-tree compl...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
TC
1998
13 years 7 months ago
1998
—The very high levels of integration and submicron device sizes used in current and emerging VLSI technologies for FPGAs lead to higher occurrences of defects and operational fau...
ICSE
2003
IEEE-ACM
14 years 7 months ago
2003
IEEE-ACM
Recent evidences indicate that most faults in software systems are found in only a few of a system's components [1]. The early identification of these components allows an or...
SIGPLAN
2002
13 years 7 months ago
2002
: Object-oriented frameworks require thorough testing as they are intended to be reused repeatedly in developing numerous applications. Moreover, whenever a framework is extended f...