93 search results - page 10 / 19 » Diagnosis of Delay Defects Using Statistical Timing Models |
DATE
2010
IEEE
14 years 13 days ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
TCAD
2008
13 years 7 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
ICIP
2002
IEEE
14 years 9 months ago
2002
IEEE
This paper presents an extensive statistical study and analysis of the effects of channel delays in the current (best-effort) Internet on underflow events in MPEG-4 video streamin...
ISQED
2003
IEEE
14 years 19 days ago
2003
IEEE
A structurally testable delay fault might become untestable in the functional mode of the circuit due to logic or timing constraints or both. Experimental data suggests that there...
TCAD
2008
13 years 7 months ago
2008
Manufacturing process variations lead to variability in circuit delay and, if not accounted for, can cause excessive timing yield loss. The familiar traditional approaches to timin...