93 search results - page 13 / 19 » Diagnosis of Delay Defects Using Statistical Timing Models |
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
SECON
2008
IEEE
14 years 1 months ago
2008
IEEE
—Delay Tolerant Networks are wireless networks where disconnections may occur frequently due to propagation phenomena, node mobility, and power outages. Propagation delays may al...
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
— In the face of increased process variations, at-speed manufacturing test is necessary to detect subtle delay defects. This procedure necessarily tests chips at a slightly highe...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
— Process variations in digital circuits make sequential circuit timing validation an extremely challenging task. In this paper, a Statistical Bellman-Ford (SBF) algorithm is pro...
MOBIHOC
2006
ACM
14 years 7 months ago
2006
ACM
The performance of a multihop wireless network is typically affected by the interference caused by transmissions in the same network. In a statistical fading environment, the inte...