93 search results - page 14 / 19 » Diagnosis of Delay Defects Using Statistical Timing Models |
EURODAC
1994
IEEE
13 years 11 months ago
1994
IEEE
- The accelerator is destined to circuit-level simulation of digital and analog/digital MOS VLSI'c containing of up to 100 thousand transistors (with 16 Mb RAM host-machine). ...
ASPDAC
2004
ACM
14 years 23 days ago
2004
ACM
— This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensit...
DATAMINE
2006
13 years 7 months ago
2006
Efficiently detecting outliers or anomalies is an important problem in many areas of science, medicine and information technology. Applications range from data cleaning to clinica...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Static timing analysis is a critical step in design of any digital integrated circuit. Technology and design trends have led to significant increase in environmental and process v...
NIPS
2008
13 years 8 months ago
2008
Identification and comparison of nonlinear dynamical system models using noisy and sparse experimental data is a vital task in many fields, however current methods are computation...