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» Diagnosis of Delay Defects Using Statistical Timing Models
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VLSID
2003
IEEE
167views VLSI» more  VLSID 2003»
14 years 7 months ago
Timing Minimization by Statistical Timing hMetis-based Partitioning
In this paper we present statistical timing driven hMetisbased partitioning. We approach timing driven partitioning from a different perspective: we use the statistical timing cri...
Cristinel Ababei, Kia Bazargan
ICSE
2005
IEEE-ACM
14 years 7 months ago
Use of relative code churn measures to predict system defect density
Software systems evolve over time due to changes in requirements, optimization of code, fixes for security and reliability bugs etc. Code churn, which measures the changes made to...
Nachiappan Nagappan, Thomas Ball
TCAD
2010
98views more  TCAD 2010»
13 years 2 months ago
Statistical Modeling With the PSP MOSFET Model
PSP and the backward propagation of variance (BPV) method are used to characterize the statistical variations of metal-oxide-semiconductor field effect transistors (MOSFETs). BPV s...
Xin Li, Colin C. McAndrew, Weimin Wu, Samir Chaudh...
ICCAD
2003
IEEE
205views Hardware» more  ICCAD 2003»
14 years 19 days ago
Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
Aseem Agarwal, David Blaauw, Vladimir Zolotov
TSE
2008
148views more  TSE 2008»
13 years 7 months ago
Benchmarking Classification Models for Software Defect Prediction: A Proposed Framework and Novel Findings
Software defect prediction strives to improve software quality and testing efficiency by constructing predictive classification models from code attributes to enable a timely ident...
Stefan Lessmann, Bart Baesens, Christophe Mues, Sw...