45 search results - page 7 / 9 » Diagonal Circuit Identity Testing and Lower Bounds |
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
ASPDAC
1998
ACM
13 years 12 months ago
1998
ACM
— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...
ICCD
2003
IEEE
14 years 4 months ago
2003
IEEE
We discuss the compaction of independent test sequences for sequential circuits. Our first contribution is the formulation of this problem as an integer program, which we then so...
STACS
2000
Springer
13 years 11 months ago
2000
Springer
We clarify the computational complexity of planarity testing, by showing that planarity testing is hard for L, and lies in SL. This nearly settles the question, since it is widely...
JCSS
2000
13 years 7 months ago
2000
We give the first nontrivial model-independent time-space tradeoffs for satisfiability. Namely, we show that SAT cannot be solved simultaneously in n1+o(1) time and n1space for an...