45 search results - page 8 / 9 » Diagonal Circuit Identity Testing and Lower Bounds |
SODA
2010
ACM
14 years 5 months ago
2010
ACM
A monotone distribution P over a (partially) ordered domain assigns higher probability to y than to x if y x in the order. We study several natural problems concerning testing pr...
TVLSI
2008
13 years 7 months ago
2008
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
ECCC
2007
13 years 7 months ago
2007
We introduce the notion of a Canonical Tester for a class of properties on distributions, that is, a tester strong and general enough that “a distribution property in the class ...
GLVLSI
1999
IEEE
13 years 12 months ago
1999
IEEE
This paper proposes a new fault coverage estimation model which can be used in the early stage of VLSI design. The fault coverage model is an exponentially decaying function with ...
FPL
2006
Springer
13 years 11 months ago
2006
Springer
Both custom IC and FPGA designs in the nanometer regime suffer from process variations. But different from custom ICs, FPGAs' programmability offers a unique design freedom t...