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WCE
2007
13 years 8 months ago
A Graph-based Framework for High-level Test Synthesis
Improving testability during the early stages of High-level synthesis has several advantages including reduced test hardware overhead and design iterations. Recently, BIST techniq...
Ali Pourghaffari bashari, Saadat Pourmozafari
IEICET
2008
57views more  IEICET 2008»
13 years 7 months ago
Impact of Well Edge Proximity Effect on Timing
This paper studies impact of the well edge proximity effect on digital circuit delay, based on model parameters extracted from test structures in an industrial 65nm wafer process. ...
Toshiki Kanamoto, Yasuhiro Ogasahara, Keiko Natsum...
INTEGRATION
2006
102views more  INTEGRATION 2006»
13 years 7 months ago
A parameterized graph-based framework for high-level test synthesis
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
Saeed Safari, Amir-Hossein Jahangir, Hadi Esmaeilz...
FTEDA
2007
156views more  FTEDA 2007»
13 years 7 months ago
FPGA Architecture: Survey and Challenges
Field-Programmable Gate Arrays (FPGAs) have become one of the key digital circuit implementation media over the last decade. A crucial part of their creation lies in their archite...
Ian Kuon, Russell Tessier, Jonathan Rose
TCAD
1998
83views more  TCAD 1998»
13 years 7 months ago
Telescopic units: a new paradigm for performance optimization of VLSI designs
—This paper introduces a novel optimization paradigm for increasing the throughput of digital systems. The basic idea consists of transforming fixed-latency units into variable-...
Luca Benini, Enrico Macii, Massimo Poncino, Giovan...