Improving testability during the early stages of High-level synthesis has several advantages including reduced test hardware overhead and design iterations. Recently, BIST techniq...
This paper studies impact of the well edge proximity effect on digital circuit delay, based on model parameters extracted from test structures in an industrial 65nm wafer process. ...
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
Saeed Safari, Amir-Hossein Jahangir, Hadi Esmaeilz...
Field-Programmable Gate Arrays (FPGAs) have become one of the key digital circuit implementation media over the last decade. A crucial part of their creation lies in their archite...
—This paper introduces a novel optimization paradigm for increasing the throughput of digital systems. The basic idea consists of transforming fixed-latency units into variable-...