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FPGA
2009
ACM
14 years 7 days ago
2009
ACM
This paper presents a new architecture for time-to-digital conversion enabling a time resolution of 17ps over a range of 50ns with a conversion rate of 20MS/s. The proposed archit...
IFIP
2001
Springer
14 years 2 days ago
2001
Springer
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
ISQED
2010
IEEE
13 years 9 months ago
2010
IEEE
Digital implementation of analog function is becoming attractive in CMOS ICs, given the low supply voltage of ultra-scaled process. The conventional fractional-N frequency synthes...
NIPS
2001
13 years 9 months ago
2001
We describe a programmable multi-chip VLSI neuronal system that can be used for exploring spike-based information processing models. The system consists of a silicon retina, a PIC...
ET
2007
13 years 7 months ago
2007
Abstract In order to perform an on-chip test for characterizing both static and transmission parameters of embedded analog-to-digital converters (ADCs), this paper presents an osci...