Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
Kewal K. Saluja, Shriram Vijayakumar, Warin Sootka...
We study (collapsible) higher-order pushdown systems -- theoretically robust and well-studied models of higher-order programs -- along with their natural subclass called (collapsi...
The level of security provided by digital rights management functions and cryptographic protocols depend heavily on the security of an embedded secret key. The current practice of...
The Monte-Carlo (MC) technique is a traditional solution for a reliable statistical analysis, and in contrast to probabilistic methods, it can account for any complicate model. How...
The oscillator problem consists of determining good initial values for the node voltages and the frequency of oscillation and the avoidance of the DC solution. Standard approaches...