787 search results - page 81 / 158 » Digital Algebra and Circuits |
VLSID
2008
IEEE
14 years 9 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
FSTTCS
2010
Springer
13 years 6 months ago
2010
Springer
We study (collapsible) higher-order pushdown systems -- theoretically robust and well-studied models of higher-order programs -- along with their natural subclass called (collapsi...
DAC
2010
ACM
14 years 19 days ago
2010
ACM
The level of security provided by digital rights management functions and cryptographic protocols depend heavily on the security of an embedded secret key. The current practice of...
TCAD
2010
13 years 3 months ago
2010
The Monte-Carlo (MC) technique is a traditional solution for a reliable statistical analysis, and in contrast to probabilistic methods, it can account for any complicate model. How...
DATE
2002
IEEE
14 years 1 months ago
2002
IEEE
The oscillator problem consists of determining good initial values for the node voltages and the frequency of oscillation and the avoidance of the DC solution. Standard approaches...