Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jas...
The analysis of CMOS VLSI circuit switching current has become an increasingly important and difficult task from both a VLSI design and simulation software perspective. This paper...
Histology is the science of understanding the structure of animals and plants, and studying the functional implications of biological structures. In this paper, we propose a stati...
Abstract. For many statistical pattern recognition methods, distributions of sample vectors are assumed to be normal, and the quadratic discriminant function derived from the proba...
We propose a novel semi-supervised method for building a statistical model that represents the relationship between sounds and text labels (“tags”). The proposed method, named...
Jun Takagi, Yasunori Ohishi, Akisato Kimura, Masas...