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DATE
2006
IEEE
111views Hardware» more  DATE 2006»
14 years 1 months ago
Extraction of defect density and size distributions from wafer sort test results
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jas...
ICCAD
1996
IEEE
151views Hardware» more  ICCAD 1996»
13 years 11 months ago
Expected current distributions for CMOS circuits
The analysis of CMOS VLSI circuit switching current has become an increasingly important and difficult task from both a VLSI design and simulation software perspective. This paper...
Dennis J. Ciplickas, Ronald A. Rohrer
ICIP
2005
IEEE
14 years 9 months ago
Statistical categorization of human histological images
Histology is the science of understanding the structure of animals and plants, and studying the functional implications of biological structures. In this paper, we propose a stati...
Dehua Zhao, Yixin Chen, Nelson Correa
SSPR
2000
Springer
13 years 11 months ago
A New Approximation Method of the Quadratic Discriminant Function
Abstract. For many statistical pattern recognition methods, distributions of sample vectors are assumed to be normal, and the quadratic discriminant function derived from the proba...
Shinichiro Omachi, Fang Sun, Hirotomo Aso
ICASSP
2011
IEEE
12 years 11 months ago
Automatic audio tag classification via semi-supervised canonical density estimation
We propose a novel semi-supervised method for building a statistical model that represents the relationship between sounds and text labels (“tags”). The proposed method, named...
Jun Takagi, Yasunori Ohishi, Akisato Kimura, Masas...