Abstract—With the increasing scaling of manufacturing technology, process variation is a phenomenon that has become more prevalent. As a result, in the context of Chip Multiproce...
Shengyan Hong, Sri Hari Krishna Narayanan, Mahmut ...
The high cost of locating faults in programs has motivated the development of techniques that assist in fault localization by automating part of the process of searching for fault...
Given the scale of massively parallel systems, occurrence of faults is no longer an exception but a regular event. Periodic checkpointing is becoming increasingly important in the...
When researching new product ideas or filing new patents, inventors need to retrieve all relevant pre-existing know-how and/or to exploit and enforce patents in their technologica...
Milan Agatonovic, Niraj Aswani, Kalina Bontcheva, ...
Large clusters of mutual dependence have long been regarded as a problem impeding comprehension, testing, maintenance, and reverse engineering. An effective visualization can aid ...