This paper explores the addition of constraints to the linear programming formulation of the support vector regression problem for the incorporation of prior knowledge. Equality an...
In nanometer regime, the effects of process variations are dominating circuit performance, power and reliability of circuits. Hence, it is important to properly manage variation e...
Abstract. Data mining algorithms such as the Apriori method for finding frequent sets in sparse binary data can be used for efficient computation of a large number of summaries fr...
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
This paper presents a robust calibration procedure for clustered wireless sensor networks. Accurate calibration of between-node distances is one crucial step in localizing sensor n...