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DELTA
2004
IEEE
13 years 11 months ago
Scan Test of IP Cores in an ATE Environment
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...
Luca Schiano, Yong-Bin Kim, Fabrizio Lombardi
DATE
2008
IEEE
106views Hardware» more  DATE 2008»
14 years 1 months ago
Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction
We present Low Power Illinois scan architecture (LPILS) to achieve power dissipation and test data volume reduction, simultaneously. By using the proposed scan architecture, dynam...
Anshuman Chandra, Felix Ng, Rohit Kapur
ADC
2007
Springer
145views Database» more  ADC 2007»
14 years 1 months ago
Selectivity Estimation by Batch-Query based Histogram and Parametric Method
Histograms are used extensively for selectivity estimation and approximate query processing. Workloadaware dynamic histograms can self-tune itself based on query feedback without ...
Jizhou Luo, Xiaofang Zhou, Yu Zhang, Heng Tao Shen...
MVA
2007
197views Computer Vision» more  MVA 2007»
13 years 8 months ago
A Simple Tone Mapping for High Dynamic Range Image Visualization Using a Pseudo-Hilbert Scan
The Hilbert curve is one of space-filling curves published by G. Peano. There are several applications using this curve, such as image processing, computer graphics, etc. In this ...
Jian Zhang, Sei-ichiro Kamata, Li Tian