989 search results - page 71 / 198 » Dynamic Symmetry Reduction |
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
This paper presents a method of dynamic voltage scaling (DVS) that tackles both switching and leakage power with combined Vdd/Vbs scaling and gives minimum average energy consumpt...
ICRA
2008
IEEE
14 years 4 months ago
2008
IEEE
— This paper proposes and experimentally validates a Bayesian network model of a range finder adapted to dynamic environments. The modeling rigorously explains all model assumpt...
CISS
2007
IEEE
14 years 4 months ago
2007
IEEE
AbstractWe consider a wireless network consisting of multiple sources communicating with their corresponding destinations utilizing a single half-duplex relay. The goal is to min...
ASPDAC
2006
ACM
14 years 4 months ago
2006
ACM
- We propose a dynamic test compaction procedure to generate high-quality test patterns for path delay faults. While the proposed procedure generates a compact two-pattern test set...
CEC
2005
IEEE
14 years 3 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...