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DATE
2003
IEEE
14 years 1 months ago
2003
IEEE
Abstract : A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodolog...
ECOOP
2008
Springer
13 years 10 months ago
2008
Springer
The adapter design pattern [1], commonly used for integration and evolution in component-based systems, is originally described by roles. In classbased systems, the conventional re...
ISPD
2007
ACM
13 years 9 months ago
2007
ACM
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...
COMPSAC
2007
IEEE
14 years 2 months ago
2007
IEEE
Bug patterns are erroneous code idioms or bad coding practices that have been proved fail time and time again. They mainly arise from the misunderstanding of language features, th...
ECOOP
2008
Springer
13 years 10 months ago
2008
Springer
Abstract. The state design pattern is the standard object-oriented programming idiom for implementing the state machine logic of interactive applications. While this pattern provid...