377 search results - page 47 / 76 » Effective TARO Pattern Generation |
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
ICDM
2007
IEEE
14 years 2 months ago
2007
IEEE
Data streams are often locally correlated, with a subset of streams exhibiting coherent patterns over a subset of time points. Subspace clustering can discover clusters of objects...
MCS
2007
Springer
14 years 1 months ago
2007
Springer
Abstract. We report on our recent progress in developing an ensemble of classifiers based algorithm for addressing the missing feature problem. Inspired in part by the random subsp...
SSDBM
2006
IEEE
14 years 1 months ago
2006
IEEE
Monitoring movement of high-dimensional points is essential for environmental databases, geospatial applications, and biodiversity informatics as it reveals crucial information ab...
DATE
2010
IEEE
14 years 23 days ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...