In recent years, several techniques have been proposed for class-level regression testing. Most of these techniques focus either on white- or black-box testing, although an integr...
DSM and nanometer VLSI designs are subject to an increasingly significant thermal effect on VLSI circuit lifetime and performance variation, which can be effectively subdued by V...
In this paper, we propose the HEC-PF scheme, an enhancement of our previous H-EC scheme for effective data forwarding in opportunistic networks. The enhanced scheme modifies the a...
Possible influences of contexts on memory for routes are investigated. Route knowledge was established by learning a route which was presented on a computer screen. Activation of k...
Sabine Schumacher, Karl Friedrich Wender, Rainer R...
1 Scan based transition tests are added to improve the detection of speed failures using scan tests. Empirical data suggests that both data volume and application time, for transi...
Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, P...