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COMPSAC
2001
IEEE
13 years 11 months ago
Integrating White- and Black-Box Techniques for Class-Level Regression Testing
In recent years, several techniques have been proposed for class-level regression testing. Most of these techniques focus either on white- or black-box testing, although an integr...
Sami Beydeda, Volker Gruhn
ICCD
2007
IEEE
212views Hardware» more  ICCD 2007»
14 years 4 months ago
Analytical thermal placement for VLSI lifetime improvement and minimum performance variation
DSM and nanometer VLSI designs are subject to an increasingly significant thermal effect on VLSI circuit lifetime and performance variation, which can be effectively subdued by V...
Andrew B. Kahng, Sung-Mo Kang, Wei Li, Bao Liu
EUC
2007
Springer
14 years 1 months ago
On Using Probabilistic Forwarding to Improve HEC-Based Data Forwarding in Opportunistic Networks
In this paper, we propose the HEC-PF scheme, an enhancement of our previous H-EC scheme for effective data forwarding in opportunistic networks. The enhanced scheme modifies the a...
Ling-Jyh Chen, Cheng-Long Tseng, Cheng-Fu Chou
SPATIALCOGNITION
2000
Springer
13 years 11 months ago
Influences of Context on Memory for Routes
Possible influences of contexts on memory for routes are investigated. Route knowledge was established by learning a route which was presented on a computer screen. Activation of k...
Sabine Schumacher, Karl Friedrich Wender, Rainer R...
ITC
2002
IEEE
94views Hardware» more  ITC 2002»
14 years 10 days ago
Techniques to Reduce Data Volume and Application Time for Transition Test
1 Scan based transition tests are added to improve the detection of speed failures using scan tests. Empirical data suggests that both data volume and application time, for transi...
Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, P...