One of the upcoming challenges in embedded processing is to incorporate an increasing amount of adaptivity in order to respond to the multifarious constraints induced by today’s...
Lars Bauer, Muhammad Shafique, Stephanie Kreutz, J...
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
Alireza Sarvi, Carthik A. Sharma, Ronald F. DeMara