192 search results - page 10 / 39 » Efficient Hierarchical Approach to Test Generation for Digit... |
APAQS
2001
IEEE
13 years 11 months ago
2001
IEEE
Integration testing has always been a challenge especially if the system under test is large with many subsystems and interfaces. This paper proposes an approach to design End-toE...
CIKM
2004
Springer
14 years 28 days ago
2004
Springer
In the recent years, the Web has been rapidly “deepened” with the prevalence of databases online. On this deep Web, many sources are structured by providing structured query i...
ITC
2000
IEEE
13 years 11 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
EGPGV
2004
Springer
14 years 28 days ago
2004
Springer
We describe a system for the texture-based direct volume visualization of large data sets on a PC cluster equipped with GPUs. The data is partitioned into volume bricks in object ...
CVPR
2006
IEEE
14 years 9 months ago
2006
IEEE
In this paper we propose an approach capable of simultaneous recognition and localization of multiple object classes using a generative model. A novel hierarchical representation ...