192 search results - page 2 / 39 » Efficient Hierarchical Approach to Test Generation for Digit... |
VTS
2002
IEEE
14 years 12 days ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
ICSE
1999
IEEE-ACM
13 years 11 months ago
1999
IEEE-ACM
The widespread use of GUIs for interacting with software is leading to the construction of more and more complex GUIs. With the growing complexity comes challenges in testing the ...
PAMI
2002
13 years 7 months ago
2002
The product of experts learning procedure [1] can discover a set of stochastic binary features that constitute a nonlinear generative model of handwritten images of digits. The qua...
ICADL
2003
Springer
14 years 21 days ago
2003
Springer
: Metadata++ is a digital library system that we are developing to serve the needs of the United States Department of Agriculture Forest Service, the United States Department of th...
ET
2002
13 years 7 months ago
2002
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...