Negative bias temperature instability (NBTI) has become a dominant reliability concern for nanoscale PMOS transistors. In this paper, we propose variable-latency adder (VL-adder) ...
The results of the latest International Probabilistic Planning Competition (IPPC-2008) indicate that the presence of dead ends, states with no trajectory to the goal, makes MDPs h...
Today's data centers offer tremendous aggregate bandwidth to clusters of tens of thousands of machines. However, because of limited port densities in even the highest-end swi...
Mohammad Al-Fares, Sivasankar Radhakrishnan, Barat...
In this paper we present an intelligent multi-topology IGP (MT-IGP) based intra-domain traffic engineering (TE) scheme that is able to handle unexpected traffic fluctuations with n...
The interrelationship between software faults and failures is quite intricate and obtaining a meaningful characterization of it would definitely help the testing community in decid...
Sigrid Eldh, Sasikumar Punnekkat, Hans Hansson, Pe...