49 search results - page 3 / 10 » Efficient Space Time Compression to Reduce Test Data Volume ... |
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
DFT
2002
IEEE
14 years 13 days ago
2002
IEEE
Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...
DFT
2002
IEEE
14 years 13 days ago
2002
IEEE
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...
ISPAN
1997
IEEE
13 years 11 months ago
1997
IEEE
This paper presents a strategy for efficiently rendering time-varying volume data on a distributed-memory parallel computer. Visualizing time-varying volume data take both large s...
ICCD
2003
IEEE
14 years 4 months ago
2003
IEEE
: Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit densities found in typical scan test vectors. Data ...