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ITC
2000
IEEE
84views Hardware» more  ITC 2000»
14 years 1 months ago
Non-intrusive BIST for systems-on-a-chip
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
Silvia Chiusano, Paolo Prinetto, Hans-Joachim Wund...
TVLSI
2008
140views more  TVLSI 2008»
13 years 10 months ago
A Novel Mutation-Based Validation Paradigm for High-Level Hardware Descriptions
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...
Jorge Campos, Hussain Al-Asaad
BMCBI
2011
13 years 1 months ago
Protein alignment algorithms with an efficient backtracking routine on multiple GPUs
Background: Pairwise sequence alignment methods are widely used in biological research. The increasing number of sequences is perceived as one of the upcoming challenges for seque...
Jacek Blazewicz, Wojciech Frohmberg, Michal Kierzy...
ICALP
2009
Springer
14 years 10 months ago
LTL Path Checking Is Efficiently Parallelizable
We present an AC1 (logDCFL) algorithm for checking LTL formulas over finite paths, thus establishing that the problem can be efficiently parallelized. Our construction provides a f...
Lars Kuhtz, Bernd Finkbeiner
ADC
2003
Springer
182views Database» more  ADC 2003»
14 years 3 months ago
CT-ITL : Efficient Frequent Item Set Mining Using a Compressed Prefix Tree with Pattern Growth
Discovering association rules that identify relationships among sets of items is an important problem in data mining. Finding frequent item sets is computationally the most expens...
Yudho Giri Sucahyo, Raj P. Gopalan