2174 search results - page 75 / 435 » Efficient Testing of Forecasts |
DAC
2009
ACM
14 years 11 months ago
2009
ACM
The discrepancy between integrated circuits' activities in normal functional mode and that in structural test mode has an increasing adverse impact on the effectiveness of ma...
DFT
2009
IEEE
14 years 4 months ago
2009
IEEE
Pre-fabrication design verification and post-fabrication chip testing are two important stages in the product realization process. These two stages consume a large part of resourc...
HICSS
2008
IEEE
14 years 4 months ago
2008
IEEE
A service-oriented architecture enables composite applications that support business processes to be defined and built dynamically from loosely coupled and interoperable web servi...
ECBS
2007
IEEE
14 years 4 months ago
2007
IEEE
Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can ...
ETS
2006
IEEE
14 years 4 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...