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DAC
2007
ACM
14 years 11 months ago
Scan Test Planning for Power Reduction
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
EMO
2006
Springer
87views Optimization» more  EMO 2006»
14 years 1 months ago
Symbolic Archive Representation for a Fast Nondominance Test
Abstract. Archives are used in Multi-Objective Evolutionary Algorithms to establish elitism. Depending on the optimization problem, an unconstrained archive may grow to an immense ...
Martin Lukasiewycz, Michael Glaß, Christian ...
SIGSOFT
2003
ACM
14 years 10 months ago
Leveraging field data for impact analysis and regression testing
Software products are often released with missing functionality, errors, or incompatibilities that may result in failures, inferior performances, or user dissatisfaction. In previ...
Alessandro Orso, Taweesup Apiwattanapong, Mary Jea...
ICCAD
2002
IEEE
116views Hardware» more  ICCAD 2002»
14 years 6 months ago
Conflict driven techniques for improving deterministic test pattern generation
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xiji...
IPPS
2007
IEEE
14 years 4 months ago
Period-Dependent Initial Values for Exact Schedulability Test of Rate Monotonic Systems
Real-time systems using Rate Monotonic fixed priority scheduling can be checked for schedulability either by pessimistic schedulability conditions or exact testing. Exact testing ...
Wan-Chen Lu, Kwei-Jay Lin, Hsin-Wen Wei, Wei Kuan ...