Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
Michael A. Kochte, Marcel Schaal, Hans-Joachim Wun...
Substrate noise caused by large digital circuits will degrade the performance of analog circuits located on the same substrate. To simulate this performance degradation, the total...
Simulation of large-scale networks requires enormous amounts of memory and processing time. One way of speeding up these simulations is to distribute the model over a number of co...
The last years have seen an increasing, albeit restricted simulation of large-scale networks on shared memory parallel platforms. As the complexity of communication protocols and ...
The UNIC code is being developed as part of the DOE’s Nuclear Energy Advanced Modeling and Simulation (NEAMS) program. UNIC is an unstructured, deterministic neutron transport c...
Dinesh K. Kaushik, Micheal Smith, Allan Wollaber, ...