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ICCAD
1991
IEEE
135views Hardware» more  ICCAD 1991»
14 years 2 months ago
DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
Torsten Grüning, Udo Mahlstedt, Hartmut Koopm...
ASPDAC
2005
ACM
96views Hardware» more  ASPDAC 2005»
14 years 21 days ago
Oscillation ring based interconnect test scheme for SOC
- We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and cr...
Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, ...
IJNSEC
2008
146views more  IJNSEC 2008»
13 years 10 months ago
Formal Protocol Design of ESIKE Based on Authentication Tests
In this paper, we first present a concrete formal protocol design approach, which is based on authentication tests, to create an Efficient and Secure Internet Key Exchange (ESIKE)...
Rui Jiang, Aiqun Hu, Jianhua Li
CSCW
2012
ACM
12 years 6 months ago
Organizing without formal organization: group identification, goal setting and social modeling in directing online production
A challenge for many online production communities is to direct their members to accomplish tasks that are important to the group, even when these tasks may not match individual m...
Haiyi Zhu, Robert Kraut, Aniket Kittur
TOOLS
2009
IEEE
14 years 5 months ago
Reusing and Composing Tests with Traits
Single inheritance often forces developers to duplicate code and logic. This widely recognized situation affects both business code and tests. In a large and complex application w...
Stéphane Ducasse, Damien Pollet, Alexandre ...