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138
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DAC
1994
ACM
15 years 6 months ago
New Techniques for Efficient Verification with Implicitly Conjoined BDDs
-- In previous work, Hu and Dill identified a common cause of BDD-size blowup in high-level design verification and proposed the method of implicitly conjoined invariants to addres...
Alan J. Hu, Gary York, David L. Dill
124
Voted
SAC
2003
ACM
15 years 8 months ago
An Initial Investigation of Test Driven Development in Industry
Test Driven Development (TDD) is a software development practice in which unit test cases are incrementally written prior to code implementation. In our research, we ran a set of ...
Boby George, Laurie A. Williams
98
Voted
PTS
2003
115views Hardware» more  PTS 2003»
15 years 4 months ago
Realizing Distributed TTCN-3 Test Systems with TCI
Distributed test setups for efficient load, performance, scalability, interworking, and end-to-end tests are gaining importance for the assessment of distributed communicating syst...
Ina Schieferdecker, Theofanis Vassiliou-Gioles
113
Voted
ISSTA
2004
ACM
15 years 8 months ago
Covering arrays for efficient fault characterization in complex configuration spaces
—Many modern software systems are designed to be highly configurable so they can run on and be optimized for a wide variety of platforms and usage scenarios. Testing such systems...
Cemal Yilmaz, Myra B. Cohen, Adam A. Porter
130
Voted
ATS
1996
IEEE
117views Hardware» more  ATS 1996»
15 years 6 months ago
Hierarchical Test Generation with Built-In Fault Diagnosis
A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from t...
Dirk Stroobandt, Jan Van Campenhout