Sciweavers

4192 search results - page 122 / 839
» Efficient testing of groups
Sort
View
DATE
1999
IEEE
85views Hardware» more  DATE 1999»
14 years 3 months ago
At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks
As an at-speed solution to board-level interconnect testing, an enhanced boundary-scan architecture utilizing a combination of slightly modified boundary-scan cells and a user-def...
Jongchul Shin, Hyunjin Kim, Sungho Kang
EOR
2002
71views more  EOR 2002»
13 years 10 months ago
Non-parametric tests of returns to scale
This paper discusses various statistics for testing hypotheses regarding returns to scale in the context of non-parametric models of technical efficiency. In addition, the paper p...
Léopold Simar, Paul W. Wilson
CHI
2007
ACM
14 years 11 months ago
Context & usability testing: user-modeled information presentation in easy and difficult driving conditions
A 2x2 enhanced Wizard-of-Oz experiment (N = 32) was conducted to compare two different approaches to presenting information to drivers in easy and difficult driving conditions. Da...
Jiang Hu, Andi Winterboer, Clifford Nass, Johanna ...
ECMDAFA
2006
Springer
107views Hardware» more  ECMDAFA 2006»
14 years 2 months ago
Mutation Analysis Testing for Model Transformations
In MDE, model transformations should be efficiently tested so that it may be used and reused safely. Mutation analysis is an efficient technique to evaluate the quality of test dat...
Jean-Marie Mottu, Benoit Baudry, Yves Le Traon
IOLTS
2008
IEEE
112views Hardware» more  IOLTS 2008»
14 years 5 months ago
A Modular Memory BIST for Optimized Memory Repair
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Most of the existing built-in self-repair solutions reuse IP-C...
Philipp Öhler, Alberto Bosio, Giorgio Di Nata...