As an at-speed solution to board-level interconnect testing, an enhanced boundary-scan architecture utilizing a combination of slightly modified boundary-scan cells and a user-def...
This paper discusses various statistics for testing hypotheses regarding returns to scale in the context of non-parametric models of technical efficiency. In addition, the paper p...
A 2x2 enhanced Wizard-of-Oz experiment (N = 32) was conducted to compare two different approaches to presenting information to drivers in easy and difficult driving conditions. Da...
Jiang Hu, Andi Winterboer, Clifford Nass, Johanna ...
In MDE, model transformations should be efficiently tested so that it may be used and reused safely. Mutation analysis is an efficient technique to evaluate the quality of test dat...
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Most of the existing built-in self-repair solutions reuse IP-C...