4192 search results - page 125 / 839 » Efficient testing of groups |
ITC
2003
IEEE
14 years 4 months ago
2003
IEEE
Today’s low cost wireless phones have driven a need to be able to economically test high volumes of complex RF IC’s at a fraction of the cost of the IC. In June of 2001 the IB...
DATE
2002
IEEE
14 years 3 months ago
2002
IEEE
In this paper, we analyze the use of UML as a starting point to go from design issues to end of production testing of complex embedded systems. The first point is the analysis of ...
ESEM
2008
ACM
14 years 17 days ago
2008
ACM
Regression testing is the verification that previously functioning software remains after a change. In this paper we report on a systematic review of empirical evaluations of regr...
MTV
2005
IEEE
14 years 4 months ago
2005
IEEE
Semiconductor manufacturers aim at deliver new devices within shorter times in order to gain market shares. First silicon debug is an important issue in order to minimize the time...
ITC
2003
IEEE
14 years 4 months ago
2003
IEEE
This paper introduces a finite memory compactor called convolutional compactor that provides compaction ratios of test responses in excess of 100x even for a very small number of ...