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ITC
2002
IEEE
102views Hardware» more  ITC 2002»
14 years 3 months ago
Fault Grading FPGA Interconnect Test Configurations
Conventional fault simulation techniques for FPGAs are very complicated and time consuming. The other alternative, FPGA fault emulation technique, is incomplete, and can be used o...
Mehdi Baradaran Tahoori, Subhasish Mitra, Shahin T...
EMSOFT
2006
Springer
14 years 2 months ago
Software partitioning for effective automated unit testing
A key problem for effective unit testing is the difficulty of partitioning large software systems into appropriate units that can be tested in isolation. We present an approach th...
Arindam Chakrabarti, Patrice Godefroid
CSEE
2006
Springer
14 years 23 days ago
On the Influence of Test-Driven Development on Software Design
Test-driven development (TDD) is an agile software development strategy that addresses both design and testing. This paper describes a controlled experiment that examines the effe...
David Janzen, Hossein Saiedian
AIRS
2008
Springer
14 years 5 months ago
On the Construction of a Large Scale Chinese Web Test Collection
The lack of a large scale Chinese test collection is an obstacle to the Chinese information retrieval development. In order to address this issue, we built such a collection compos...
Hongfei Yan, Chong Chen, Bo Peng, Xiaoming Li
SIGIR
2010
ACM
14 years 2 months ago
Reusable test collections through experimental design
Portable, reusable test collections are a vital part of research and development in information retrieval. Reusability is difficult to assess, however. The standard approach— si...
Ben Carterette, Evangelos Kanoulas, Virgiliu Pavlu...