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GLVLSI
1997
IEEE
92views VLSI» more  GLVLSI 1997»
14 years 2 months ago
An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation
H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor V...
DAC
1997
ACM
14 years 2 months ago
Efficient Testing of Clock Regenerator Circuits in Scan Designs
Rajesh Raina, Robert Bailey, Charles Njinda, Rober...
VLSID
1995
IEEE
112views VLSI» more  VLSID 1995»
14 years 1 months ago
An efficient automatic test generation system for path delay faults in combinational circuits
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
WSCG
2004
108views more  WSCG 2004»
13 years 11 months ago
Efficient Approximate Visibility Testing Using Occluding Spheres
László Szécsi, Lászl&o...